Request a Quote for Voron Electronics Corp Part Number TS268EU with the NSN 6625-00-923-6534

Part Number: TS268EU

Manufacturer: Voron Electronics Corp

NSN: 6625-00-923-6534

NIIN: 009236534

Item Name : Test Set Semiconduc

CAGE Code: 94518

FSC: 6625 Electrical and Electronic Properties Measuring and Testing Instruments

FSG: 66 Instruments and Laboratory Equipment

Country : USA

NCB Code : 00

Maintenance Parts Pro is pleased to offer procurement options for Voron Electronics Corp part number TS268EU, a Test Set Semiconduc product we carry that is listed with the NSN 6625-00-923-6534 for seamless identification. As this item is available for purchase today, be sure to fill out and submit the Request for Quote (RFQ) form on this page if you are interested in obtaining pricing information. All that we ask is that you share details like your budget, desired quantity, and expected fulfillment speed so that we can respond with the most fitting solutions for your comparisons.

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Alongside streamlined quotation processes, we aim to support our customers by providing as much relevant listing information and data with product offerings as possible. For example, part number TS268EU specifically traces back to Voron Electronics Corp through CAGE Code 94518, as well as belongs to the FSC [FSC] as per its NSN of 6625-00-923-6534. Referencing such details, you can locate and procure exact specifications with ease. With our various practices in mind, do not hesitate to request a quote on part number TS268EU using our provided form.

Characteristics Data of NSN 6625-00-923-6534, 6625009236534

MRC	Criteria	Characteristic
ABRY	Length	8.187 INCHES NOMINAL
MRC	Decoded Requirement	Clear Text Reply
HGTH	Height	3.625 INCHES NOMINAL
AQXZ	Operating Test Capability	FRONT RESISTANCE-NOT GREATER THAN 0.5 KILOHM FOR A GOOD CRYSTAL; BACK RESISTANCE-RATIO OF BACK TO FRONT RESISTANCE GREATER THAN 10 TO 1 FOR A GOOD CRYSTAL; BACK CURRENT-CRYSTAL SHOULD NOT INDICATE CURRENT GREATER THAN - CRYSTAL IN21 AND IN23,IN23A,IN25,IN21A AND IN23B,IN21B,IN26 WE,IN26 SYL,IN78 SYL - CURRENT D. C. 0.400 MA,0.300 MA,0.250 MA,0.175 MA,0.125 MA,0.110 MA,0.230 MA,0.160 MA
ABGL	Width	6.000 INCHES NOMINAL
AQXY	Test Type For Which Designed	FRONT RESISTANCE OF CRYSTAL; BACK RESISTANCE OF CRYSTAL; BACK CURRENT OF CRYSTAL
ALSF	Internal Battery Accommodation	INCLUDED
ANPZ	Inclosure Feature	SINGLE ITEM W/CARRYING CASE